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ANALYSIS OF PARALLEL SCHOTTKY CONTACTS BY DIFFERENTIAL INTERNAL PHOTOEMISSION SPECTROSCOPYOKUMURA T; TU KN.1983; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1983; VOL. 54; NO 2; PP. 922-927; BIBL. 14 REF.Article

INFLUENCE OF EXTRAPOLATION OF THE INTERFERENCE FUNCTION OF AMORPHOUS PD₈₃SI₁₇ ON THE RADIAL DISTRIBUTION FUNCTIONCERVEN I; WEIS J.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 72; NO 2; PP. K181-K184; BIBL. 5 REF.Article

MATERIAL REACTIONS AL/PD₂SI/SI JUNCTIONS. II: KINETIC RATESHO PS; LEWIS JE; KOSTER U et al.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 11; PART. 1; PP. 7445-7449; BIBL. 13 REF.Article

IDEAL ELASTIC, ANELASTIC AND VISCOELASTIC DEFORMATION OF A METALLIC GLASSTAUB AI; SPAEPEN F.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 11; PP. 3087-3092; BIBL. 22 REF.Article

POSITRON LIFETIME MEASUREMENTS ON ELECTRON IRRADIATION DAMAGE IN AMORPHOUS PD₈₀SI₂₀ AND CU₅₀TI₅₀ ALLOYSYLI KAUPPILA J; MOSER P; KUNZI H et al.1982; APPL. PHYS., A, SOLIDS SURF.; DEU; DA. 1982; VOL. 27; NO 1; PP. 31-33; BIBL. 11 REF.Article

CREEP, STRESS RELAXATION AND STRUCTURAL CHANGE OF AMORPHOUS ALLOYS = FLUAGE, RELAXATION DE CONTRAINTE ET MODIFICATION STRUCTURALE DES ALLIAGES AMORPHESTAUB AI; LUBORSKY FE.1981; ACTA METALL.; ISSN 0001-6160; USA; DA. 1981; VOL. 29; NO 12; PP. 1939-1948; ABS. FRE/GER; BIBL. 37 REF.Article

LATTICE IMAGING OF SILICIDE-SILICON INTERFACES AND THE INTERPRETATION OF INTERFACIAL DEFECTSFOLL H.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 69; NO 2; PP. 779-788; ABS. GER; BIBL. 21 REF.Article

High-reliability interconnections for ULSI using Al-Si-Pd-Nb/Mo layered filmsONUKI, J; KOUBUCHI, Y; SUWA, M et al.I.E.E.E. transactions on electron devices. 1992, Vol 39, Num 6, pp 1322-1326, issn 0018-9383Article

EQUILIBRIUM SILICIDES OF PALLADIUM = SILICIURES DE PALLADIUM A L'EQUILIBREWYSOCKI JA; DUWEZ PE.1981; METALL. TRANS. A; ISSN 0360-2133; USA; DA. 1981; VOL. 12; NO 8; PP. 1455-1460; BIBL. 16 REF.Article

EVOLUTION STRUCTURALE D'ALLIAGES PD-SI AMORPHES EN FONCTION DE LA TEMPERATURE = STRUCTURAL EVOLUTION OF AMORPHOUS PD-SI ALLOY AS A FUNCTION OF TEMPERATURESADOC JF; LARIDJANI M.1981; J. PHYS.; ISSN 0302-0738; FRA; DA. 1981; VOL. 42; NO 22; PP. L485-L489; ABS. ENG; BIBL. 6 REF.Article

CHARACTERISATION OF MODELS OF MULTICOMPONENT AMORPHOUS METALS: THE RADICAL ALTERNATIVE TO THE VORONOI POLYHEDRON = CARACTERISATION DES MODELES DES METAUX AMORPHES A COMPOSANTS MULTIPLES: LE RADICAL ALTERNATIF AU POLYEDRE DE VORONOIGELLATLY BJ; FINNEY JL.1982; JOURNAL OF NON-CRYSTALLINE SOLIDS; ISSN 0022-3093; NLD; DA. 1982; VOL. 50; NO 3; PP. 313-329; BIBL. 9 REF.Article

SAXS STUDY ON THE STRUCTURE AND CRYSTALLIZATION OF AMORPHOUS METALLIC ALLOYS = ETUDE PAR DIFFUSION CENTRALE DE RAYONS X (SAXS) DE LA STRUCTURE ET DE LA CRISTALLISATION DES ALLIAGES METALLIQUES AMORPHESOSAMURA K; SHIBUE K; SUZUKI R et al.1981; COLLOID POLYM. SCI.; ISSN 0303-402X; DEU; DA. 1981; VOL. 259; NO 6; PP. 677-682; BIBL. 9 REF.Article

SURFACE STRUCTURE OF EPITAXIAL PD₂SI THIN FILMS = STRUCTURE DE SURFACE DE COUCHES MINCES EPITAXIQUES DE PD₂SIOURA K; OKADA S; KISHIKAWA Y et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 2; PP. 138-140; BIBL. 25 REF.Article

COMPOUNDS IN THE PD-SI AND PT-SI SYSTEM OBTAINED BY ELECTRON BOMBARDMENT AND POST-THERMAL ANNEALING = COMPOSES DANS LES SYSTEMES PD-SI ET PT-SI OBTENUS PAR BOMBARDEMENT ELECTRONIQUE ET POST-RECUIT THERMIQUEMAJNI G; NAVA F; OTTAVIANI G et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 6; PP. 4055-4061; BIBL. 11 REF.Article

GROWTH KINETICS OF PD₂SI FROM EVAPORATED AND SPUTTER-DEPOSITED FILMS = CINETIQUE DE CROISSANCE DE PD₂SI A PARTIR DE COUCHES MINCES EVAPOREES ET DEPOSEES PAR PULVERISATIONCHEUNG NW; NICOLET MA; WITTMER M et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 79; NO 1; PP. 51-60; BIBL. 16 REF.Article

ELECTRICAL AND STRUCTURAL PROPERTIES OF ION-IMPLANTED AND POST-ANNEALED SILICIDE FILMSSORIMACHI Y; ISHIWARA H; YAMAMOTO H et al.1982; JAPANESE JOURNAL OF APPLIED PHYSICS; ISSN 0021-4922; JPN; DA. 1982; VOL. 21; NO 5; PART. 1; PP. 752-756; BIBL. 7 REF.Article

NEUTRON AND X-RAY DIFFRACTION STUDIES OF THE STRUCTURE OF METALLIC GLASSES = ETUDES PAR DIFFRACTION DE RAYONS X ET DE NEUTRONS DE LA STRUCTURE DES VERRES METALLIQUESWAGNER CNJ; RUPPERSBERG H.1981; AT. ENERGY REV.; ISSN 0004-7112; AUT; DA. 1981; SUPPL. 1; PP. 101-141; BIBL. 49 REF.Article

STUDIES OF AMORPHOUS METALS AND ALLOYS BY POSITRON ANNIHILATION AND POSITIVE MUON RESEARCH = ETUDE DES METAUX ET ALLIAGES AMORPHES PAR ANNIHILATION DE POSITONS ET RECHERCHE DE MUONS POSITIFSDOYAMA M.1981; AT. ENERGY REV.; ISSN 0004-7112; AUT; DA. 1981; SUPPL. 1; PP. 229-254; BIBL. 39 REF.Article

Investigation of the atomic structure and visibility of crystal/amorphous interfaces in Pd₈₀Si₂₀ alloy by HRTEM image simulationsSHIEH, P. C; STANWOOD, C. O; HOWE, J. M et al.Ultramicroscopy. 1991, Vol 35, Num 2, pp 99-109, issn 0304-3991Article

Viscosity of molten Pd₈₂Si₁₈ and the scaling of viscosities of glass forming systemsTSANG, K. H; KUI, H. W.Journal of applied physics. 1992, Vol 72, Num 1, pp 93-96, issn 0021-8979Article

Effects of ambient gases on ion emission stability of liquid-metal ion sourcesARIMOTO, H; MIYAUCHI, E; HASHIMOTO, H et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1987, Vol 5, Num 5, pp 1368-1371, issn 0734-211XArticle

Growth and electrical characteristics of palladium silicide contacts on dry-etched silicon surfacesCLIMENT, A; FONASH, S. J.Journal of applied physics. 1984, Vol 56, Num 4, pp 1063-1069, issn 0021-8979Article

ELECTRON BEAM INDUCED REACTIONS IN METAL/SI SYSTEMS = REACTIONS INDUITES PAR FAISCEAU D'ELECTRONS DANS LES SYSTEMES METAL/SIMAJNI G; NAVA F; OTTAVIANI G et al.1982; VACUUM; ISSN 0042-207X; GBR; DA. 1982; VOL. 32; NO 1; PP. 11-18; BIBL. 9 REF.Article

Electromigration and diffusion of hydrogen in amorphous alloys of Pd₈₂Si₁₈-typePIETRZAK, R; SZATANIK, R; ROZENFELD, B et al.Journal of materials science letters. 1991, Vol 10, Num 8, pp 455-458, issn 0261-8028, 4 p.Article